CSE/ISE
Masters
SP-387
Few-Shot Learning for Industrial Defect Detection
Detect new defect types from a handful of examples and compare meta-learning approaches. You will learn few-shot methods, industrial dataset practice and deployment constraints.
₹25,999
What's included
- Complete source code — delivered after payment
- Step-by-step deployment guide
- Project PPT
- Full training support — help at every step